@article{Galli15, author={Lorenzo Galli and Sang-Kil Son and Thomas A. White and Robin Santra and Henry N. Chapman and Max H. Nanao}, title={Towards {RIP} using free electron laser {SFX} data}, journal={J. Synchrotron Radiat.}, volume={22}, pages={249--255}, year={2015}, keywords={HIP; high-intensity phasing; RIP; HI-RIP; MAD; x-ray crystallography; SFX; radiation damage; phase problem; XFEL; XATOM; CFEL; DESY;}, url={https://doi.org/10.1107/S1600577514027854}, doi={10.1107/S1600577514027854}, abstract={Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.}
}