%% The BibTeX file generated by www.zannavi.com/biblio %% All publications containing “x-ray crystallography” @article{Son11e, author={Sang-Kil Son and Henry N. Chapman and Robin Santra}, title={Multiwavelength anomalous diffraction at high x-ray intensity}, journal={Phys. Rev. Lett.}, volume={107}, pages={218102}, year={2011}, keywords={MAD; x-ray scattering; x-ray diffraction; dispersion; x-ray crystallography; nanocrystal; molecular imaging; damage; phase problem; XATOM; XFEL; CFEL; DESY;}, url={https://doi.org/10.1103/PhysRevLett.107.218102}, doi={10.1103/PhysRevLett.107.218102} } @article{Son13, author={Sang-Kil Son and Henry N. Chapman and Robin Santra}, title={Determination of multiwavelength anomalous diffraction coefficients at high x-ray intensity}, journal={J. Phys. B: At. Mol. Opt. Phys.}, volume={46}, pages={164015}, year={2013}, keywords={MAD; x-ray scattering; x-ray diffraction; dispersion; x-ray crystallography; nanocrystal; molecular imaging; damage; phase problem; XATOM; XFEL; CFEL; DESY;}, note={special issue on frontiers of free-electron laser science}, url={https://arxiv.org/abs/1305.3489}, doi={10.1088/0953-4075/46/16/164015} } @article{Galli15, author={Lorenzo Galli and Sang-Kil Son and Thomas A. White and Robin Santra and Henry N. Chapman and Max H. Nanao}, title={Towards {RIP} using free electron laser {SFX} data}, journal={J. Synchrotron Radiat.}, volume={22}, pages={249--255}, year={2015}, keywords={HIP; high-intensity phasing; RIP; HI-RIP; MAD; x-ray crystallography; SFX; radiation damage; phase problem; XFEL; XATOM; CFEL; DESY;}, url={https://doi.org/10.1107/S1600577514027854}, doi={10.1107/S1600577514027854} } @article{Galli15a, author={Lorenzo Galli and Sang-Kil Son and M. Klinge and S. Bajt and A. Barty and R. Bean and C. Betzel and K. R. Beyerlein and C. Caleman and R. B. Doak and M. Duszenko and H. Fleckenstein and C. Gati and B. Hunt and R. A. Kirian and M. Liang and M. H. Nanao and K. Nass and D. Oberth{\"u}r and L. Redecke and R. Shoeman and F. Stellato and C. H. Yoon and T. A. White and O. Yefanov and J. Spence and H. N. Chapman}, title={Electronic damage in {S} atoms in a native protein crystal induced by an intense x-ray free-electron laser pulse}, journal={Struct. Dyn.}, volume={2}, pages={041703}, year={2015}, keywords={HIP; high-intensity phasing; RIP; HI-RIP; MAD; x-ray crystallography; SFX; radiation damage; phase problem; LCLS; experiment; XFEL; XATOM; CFEL; DESY;}, note={special issue on biology with x-ray lasers 2}, url={https://doi.org/10.1063/1.4919398}, doi={10.1063/1.4919398} } @article{Galli15b, author={Lorenzo Galli and Sang-Kil Son and Thomas R. M. Barends and Thomas A. White and Anton Barty and Sabine Botha and S{\'e}bastien Boutet and Carl Caleman and R. Bruce Doak and Max H. Nanao and Karol Nass and Robert L. Schoeman and Nicusor Timneanu and Robin Santra and Ilme Schlichting and Henry N. Chapman}, title={Towards phasing using high x-ray intensity}, journal={IUCrJ}, volume={2}, pages={627--634}, year={2015}, keywords={HIP; high-intensity phasing; MAD; x-ray crystallography; SFX; radiation damage; phase problem; LCLS; experiment; XFEL; XATOM; CFEL; DESY;}, url={https://doi.org/10.1107/S2052252515014049}, doi={10.1107/S2052252515014049} } @article{Han15, author={Huijong Han and Petri Kursula}, title={The Olfactomedin Domain from Gliomedin is a $\beta$-Propeller with Unique Structural Properties}, journal={J. Biol. Chem.}, volume={290}, pages={3612--3621}, year={2015}, keywords={Cell-surface Protein; Crystal Structure; Myelin; Neurodevelopment; Protein Domain; Protein Structure; Schwann Cells; Structural Biology; X-ray Crystallography; Olfactomedin;}, url={https://doi.org/10.1074/jbc.M114.627547}, doi={10.1074/jbc.M114.627547} } @article{Abdullah18a, author={Malik Muhammad Abdullah and Sang-Kil Son and Zoltan Jurek and Robin Santra}, title={Towards the theoretical limitations of x-ray nanocrystallography at high intensity: the validity of the effective-form-factor description}, journal={IUCrJ}, volume={5}, pages={699--705}, year={2018}, keywords={XATOM; XMDYN; XSINC; nanocrystal; SFX; radiation damage; MAD; x-ray crystallography; x-ray diffraction; x-ray scattering; CFEL; DESY;}, url={https://doi.org/10.1107/S2052252518011442}, doi={10.1107/S2052252518011442} }