All citations with Sang-Kil Son containing “nanocrystal” and “DESY”

1. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Multiwavelength anomalous diffraction at high x-ray intensity, Phys. Rev. Lett. 107, 218102 (2011) [BibTeX][pdf][abstract]doi:10.1103/PhysRevLett.107.218102
2. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Multi-wavelength anomalous diffraction phasing method at high intensity in New Science Opportunities at FLASH (DESY, Hamburg, Germany, October 12-14, 2011) [oral presentation] [BibTeX][pdf][slide: 8Mb][abstract][link]
3. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Multiwavelength anomalous diffraction at high x-ray intensity in European XFEL and HASYLAB Users' Meeting (DESY, Hamburg, Germany, January 25-27, 2012) [poster] [BibTeX][poster: 4Mb][abstract][link]
4. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Multiwavelength anomalous diffraction at high x-ray intensity in DPG Spring Meeting of the Section AMOP (German Physical Society, Stuttgart, Germany, March 12-16, 2012) [oral presentation] [BibTeX][slide: 4Mb][abstract][link]
5. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Multiwavelength anomalous diffraction at high x-ray intensity in Science at FELs (DESY, Hamburg, Germany, July 15-18, 2012) [poster] [BibTeX][pdf][abstract][link]
6. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Multiwavelength anomalous diffraction at high x-ray intensity in Ultrafast Dynamic Imaging of Matter (Banff, Canada, July 1-3, 2012) [oral presentation] [BibTeX][pdf][slide: 6Mb][abstract][link]
7. Sang-Kil Son, Multiwavelength anomalous diffraction phasing method at high x-ray intensity in The 24th PLS Synchrotron Radiation Users' Workshop (POSTECH, Pohang, Korea, November 22, 2012) [invited talk] [BibTeX][slide: 7Mb][abstract][link]
8. Sang-Kil Son, Henry N. Chapman, and Robin Santra, Determination of multiwavelength anomalous diffraction coefficients at high x-ray intensity, J. Phys. B: At. Mol. Opt. Phys. 46, 164015 (2013) [special issue on frontiers of free-electron laser science] [BibTeX][pdf][abstract][link]doi:10.1088/0953-4075/46/16/164015
9. Sang-Kil Son, Multiwavelength anomalous diffraction at high x-ray intensity in Workshop on Resonant Elastic X-ray Scattering in Condensed Matter (Oxford, United Kingdom, July 15-19, 2013) [invited talk] [BibTeX][pdf][slide: 9Mb][abstract][link]
10. Sang-Kil Son, Turning photoionization at high x-ray intensity into an advantage for femtosecond nanocrystallography in Photoionization and Photodetachment (Gordon Research Conference, Galveston, Texas, United States, February 23-28, 2014) [invited talk] [BibTeX][link]
11. Sang-Kil Son, Happy phasing with electronic radiation damage at high x-ray intensity in 8th International Workshop on X-ray Radiation Damage to Biological Crystalline Samples (Hamburg, Germany, April 10-12, 2014) [invited talk] [BibTeX][slide: 5Mb][abstract][link]
12. Sang-Kil Son, High-intensity phasing with x-ray free-electron lasers in CCP4 Study Weekend (Nottingham, United Kingdom, January 7-9, 2015) [invited talk] [BibTeX][slide: 5Mb][abstract][link]
13. Sang-Kil Son, Phasing with electronic radiation damage at high x-ray intensity in BioXFEL STC 2nd Annual International Conference (Ponce, Puerto Rico, January 14-16, 2015) [invited talk] [BibTeX][slide: 6Mb][abstract][link]
14. Sang-Kil Son, Lorenzo Galli, Henry N. Chapman, and Robin Santra, High-intensity phasing 
with x-ray free-electron lasers in European XFEL and DESY Photon Science Users' Meeting (DESY, Hamburg, Germany, January 28-30, 2015) [poster] [BibTeX][poster: 4Mb][abstract][link]
15. Malik Muhammad Abdullah, Zoltan Jurek, Sang-Kil Son, and Robin Santra, Calculation of x-ray scattering patterns from nanocrystals at high x-ray intensity, Struct. Dyn. 3, 054101 (2016) [BibTeX][pdf][abstract]doi:10.1063/1.4958887
16. Malik Muhammad Abdullah, Sang-Kil Son, Zoltan Jurek, and Robin Santra, Towards the theoretical limitations of x-ray nanocrystallography at high intensity: the validity of the effective-form-factor description, IUCrJ 5, 699–705 (2018) [BibTeX][pdf][abstract]doi:10.1107/S2052252518011442

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